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Wednesday, April 22, 2020 | History

4 edition of ISTFA 2004 found in the catalog.

ISTFA 2004

International Symposium for Testing and Failure Analysis (30th 2004 Boston, Mass.)

ISTFA 2004

proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester"s Centrum Centre, Worcester (Boston), Massachusetts

by International Symposium for Testing and Failure Analysis (30th 2004 Boston, Mass.)

  • 213 Want to read
  • 27 Currently reading

Published by ASM International in Materials Park, Ohio .
Written in English

    Subjects:
  • Electronics -- Materials -- Testing -- Congresses,
  • Electronic apparatus and appliances -- Testing -- Congresses

  • Edition Notes

    Includes bibliographical references and index.

    Statementsponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASM International.
    GenreCongresses.
    ContributionsASM International., Electronic Device Failure Analysis Society.
    Classifications
    LC ClassificationsTK7871 .I583 2004
    The Physical Object
    Paginationxx, 697 p. :
    Number of Pages697
    ID Numbers
    Open LibraryOL3438997M
    ISBN 100871708078
    LC Control Number2005298158
    OCLC/WorldCa57520753

    This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.


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